英语翻译李生有关SPS所提到归零的问题,L,R这两部分在归零时是采用测试端短路方式因此在短路归零后所得到的测试值比较稳定,但在C状态下归零方式采用测试端开路方式,因此归零后比较会

Question

英语翻译
李生
有关SPS所提到归零的问题,L ,R 这两部分在归零时是采用测试端短路方式
因此在短路归零后所得到的测试值比较稳定,但在C状态下归零方式采用测试端
开路方式,因此归零后比较会受到环境影响出现 0.5 1.5pF 左右跳动.
且测试产品时测试线要与刚做开路归零时的位置与距离一致.
如果将测试线放在有隔离的环境中则会改善此现象,还有测量小电容(几pF)
一般都会采用较高频率测是这样测值将会比较稳定(10KHz).
 

Answer 1

mr.li
The SPS mentioned about the problem, the zero L, these two sections in return R by testing the circuit is zero
So in short after zero of testing is stable, but in C condition by testing the zero way
Open mode, so after zero by environmental impact is 0.5 ~ 1.5 pF beat around.
And when to test the product line with just do test open to zero distance and position.
If there will be a test line in the environment of isolation, and improve the phenomenon of small capacitance measurement (pF)
Usually adopts high frequency measurement is such measurements will be more stable (10KHz).